selected publications
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academic article
- Analysis of grain structure evolution based on optical measurements of mc-Si wafers. Solar Energy Materials and Solar Cells. 2018
- Grain boundaries and dislocations in Si-bricks: inline characterization on as-cut wafers. Energy Procedia. 2017
- Analysis of grain structure evolution based on optical measurements of mc Si wafers. Journal of Crystal Growth. 454:147-155. 2016
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conference paper
- Analysis of grain structure evolution via image processing based on optical measurements of mc Si wafers. . 2016
- Tomographic Defect Reconstruction of Multicrystalline Silicon Ingots Using Photoluminescence Images of As-Cut Wafers and Solar Cells. World Conference on Photovoltaic Energy Conversion. 636-641. 2012