selected publications
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chapter
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conference paper
- Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures. . 360. 2014
- Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures. Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014. 2014
- Structural In-Field Diagnosis for Random Logic Circuits. . 2011
- BISD: scan-based built-in self-diagnosis. Design, Automation, and Test in Europe. 1243-1248. 2010