Test Engineering for CMOS Gate Arrays with the CAD-System VENUS 1 Academic Article

authors

Scherer, Olaf

publication date

November 1, 1986

has subject area

published in

IEEE Transactions on Industrial Electronics Journal

Digital Object Identifier (DOI)

https://doi.org/10.1109/tie.1986.350907

start page

400

end page

403

volume

IE-33

issue

4